Magnetic force imaging (MFM) of 2D topological insulators, such as crystalline plates of Bi2Te3 and Bi2Se3, reveals anomalously large contrast around the plate edges even under ambient imaging conditions. And while there are several known contrast mechanisms in MFM, these cannot easily explain the magnitude of contrast observe for such systems. In this work we use multi-parameter magnetic force phase imaging together with a simple analytical model to suggest that the observed magnetic edge-features can be associated with two sources: a pseudo-Faraday effect in the conductive edge channels of the topological system and magnetic scattering in those channels caused by the proximal, localized field of the tip. These results suggest novel MFM contrast mechanisms unique to topological systems and point to the utility of multi-parameter MFM techniques in studies of topological-material-based circuit elements.