The cubic Cu₃Au-type XPt₃ family (X = V, Cr, and Mn) is a topological semimetal characterized by anti-crossing gapped nodal lines near the Fermi level, which give rise to significant Berry curvatures and thus to the anomalous Hall effect (AHE). Among the three members, CrPt₃ has been experimentally verified to exhibit a large anomalous Hall conductivity (AHC), while its counterparts MnPt₃ and VPt₃ remain largely unexplored. Here, a series of MnPt₃ thin films with varying thicknesses (20–70 nm) was epitaxially grown on the MgO substrates using magnetron sputtering and was systematically investigated by magnetization, electrical resistivity, and Hall resistivity measurements. MnPt₃ films undergo a ferromagnetic transition at a Curie temperature TC, which increases as the film thickness increases, reaching ∼ 344 K for the 70-nm-thick film. All the anomalous Hall transport properties of MnPt₃ films, including the resistivity, conductivity, and angle, exhibit a strong correlation with their magnetic properties. The scaling analysis suggests that the intrinsic Berry-curvature mechanism dominates the observed AHE, while the extrinsic contributions are much smaller. The intrinsic AHC increases as the film thickness increases, while the extrinsic AHC is thickness-independent. Such an enhanced intrinsic AHC in the MnPt₃ films is most likely attributed to the strain effect, implying that it serves as an effective method to tune the electronic band topology in the XPt₃ topological semimetal.