The recent development of wavelength-scale nonlinear waveguides highlights the need for new diagnostic methods that characterize both waveguide dispersion and fabrication-induced spatial inhomogeneities. While tightly confining waveguides enable compact and highly efficient nonlinear devices, nanometer-scale waveguide nonuniformities can limit the effective interaction length and conversion efficiency. In this work, we establish a high-throughput diagnostic method for second-order nonlinear waveguides based on near-degenerate three-wave mixing, hereafter referred to as sum-frequency tomography (SFT). In contrast with conventional diagnostics based on second-harmonic generation, SFT produces two-dimensional transfer functions that allow dispersion orders to be characterized separately from longitudinal phase-mismatch variations. We validate this technique using commercially available PPLN waveguides and show that SFT recovers the group-velocity mismatch between the interacting waves, the group-velocity dispersion of the fundamental, and a low-order polynomial approximation of the longitudinal phase-mismatch profile. SFT avoids the experimental complexities of phase-sensitive or spatially resolved measurements, enabling the characterization of individual waveguides in seconds.